Yandex.Metrika counter

GOST 26239.5-84

GOST 26239.5-84
Hover to load preview image

Name in English:
GOST 26239.5-84

Name in Russian:
ГОСТ 26239.5-84

Description in English:

Semiconductor silicon and quartz. Method of impurities determination

Description in Russian:
Кремний полупроводниковый и кварц. Метод определения примесей

Document status:
Active

Format:
Electronic (PDF)

Page count:
18

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
1 business day

SKU:
GOST30324

Choose Document Language:
€10
Need Help?

Customers who bought this item also bought

GOST 26-75
Slotters. Standards of accuracy and rigidity
€10
GOST R 7.0.14-2011
System of standards on information, librarianship and publishing. Reference Editions. Basic types, structure, publishing and printing presentation
€10
GOST 16195-70
Blanks of male dies holders for wedged and flanged fixing of male dies of horizontal forging machines. Construction and dimensions
€10
GOST R ISO/IEC TO 10183-1-2000
Information technology. Text and office systems. Office Document Architecture (ODA) and interchange format. Technical Report on ISO 8613 implementation testing. Part 1. Testing methodology
€10
GOST 16483.24-73
Wood. Determination method of modulus of elasticity in compression along fibres
€10
GOST 13047.19-2002
Nickel. Cobalt. Method for determination of aluminium
€10