Russian standards
Unified system for program documentation. Maintenance manual. Requirements for contents and form of presentation
Document status: Active
Field-effect transistors. Drain residual current measurement technique
Document status: Active
Field-effect transistors. Gate leakage current measurement technique
Document status: Active
Field-effect transistors. Threshold and cut-off voltage measurement technique
Document status: Active
Field-effect transistors. Drain current for v(gs)=0 measurement technique
Document status: Active
