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Unified system for program documentation. Description of use. Requirements for contents and form of presentation
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Unified system for program documentation. Programmer`s guide. Requirements for contents and form of presentation
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Unified system for program documentation. Maintenance manual. Requirements for contents and form of presentation
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Field-effect transistors. Drain residual current measurement technique
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Field-effect transistors. Gate leakage current measurement technique
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Field-effect transistors. Threshold and cut-off voltage measurement technique
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