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Field-effect transistors. General requirements for measuring electrical parameters
Document status: Active
Automatic identification. Biometrics. Biometric performance testing and reporting. Part 2. Testing methodologies for technology and scenario evaluation
Document status: Active
Radioelectronic equipment electromagnetic compatibility. High-power bipolar high-frequency linear transistors, intermodulation component coefficient standards
Document status: Active
Bipolar transistors. Methods of time parameters measurement
Document status: Active
Photocells. Method of characteristics measurements. General
Document status: Active
Electromagnetic compatibility of technical equipment. Arc welding equipment. Requirements and test methods
Document status: Replaced by GOST R 51526-2012
