IEC 62228-2-2016 PDF

Full title and description

IEC 62228-2:2016 - Integrated circuits — EMC evaluation of transceivers — Part 2: LIN transceivers. This International Standard specifies test and measurement methods, test configurations and setups, test signals and failure criteria for electromagnetic compatibility (EMC) evaluation of LIN transceiver integrated circuits (both stand-alone LIN transceivers and ICs with embedded LIN transceivers) under network operating conditions.

Abstract

IEC 62228-2 defines procedures for assessing EMC performance of LIN transceiver ICs used in wired network applications. It describes required emission and immunity tests (including RF emissions, RF immunity, impulse immunity and electrostatic discharge), the functional test modes and relevant pin definitions (for example LIN, VBAT and local WAKE), test boards and evaluation criteria to determine whether a LIN transceiver meets EMC requirements in realistic network conditions.

General information

• Status: International Standard (published / active).
• Publication date: 18 November 2016.
• Publisher: International Electrotechnical Commission (IEC).
• ICS / categories: 31.200 (Integrated circuits / Microelectronics).
• Edition / version: Edition 1.0 (2016).
• Number of pages: 85 (IEC electronic publication format).

Scope

This part of IEC 62228 applies to standard LIN transceiver ICs and ICs with embedded LIN transceivers. It covers EMC evaluation performed in functional operation modes under network conditions and specifies tests for RF emission, RF immunity, impulse immunity and electrostatic discharge (ESD). The document defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and dedicated test boards/pins considered EMC‑relevant for LIN transceivers.

Key topics and requirements

• Definition of EMC-relevant pins and functional modes for LIN transceivers (e.g., LIN, VBAT, local WAKE).
• Conducted and radiated RF emission measurement methods and limits relevant to IC-level testing.
• Immunity test procedures for RF disturbances and transient/impulse events under network conditions.
• Electrostatic discharge (ESD) test methods on unpowered transceiver ICs (direct and indirect ESD tests).
• Detailed test setups, reference test boards, wiring and coupling arrangements to reproduce network conditions.
• Pass/fail (failure) criteria and reporting requirements for EM performance of LIN transceiver ICs.

Typical use and users

Used by semiconductor design and test engineers, EMC laboratories, automotive and industrial IC manufacturers, product qualification teams, and certification bodies to verify EMC performance of LIN transceiver ICs during design validation, production qualification and component acceptance testing. Test houses and integrators performing device-level EMC assessments for wired vehicle networks also use this standard.

Related standards

IEC 62228-2 is part of the IEC 62228 series for EMC evaluation of transceivers. Relevant related parts include IEC 62228-1 (Part 1: General conditions and definitions, published as IEC 62228-1:2018) and IEC 62228-3 (Part 3: CAN transceivers, published 2019 with later corrigenda). National/adopted variants appear as EN/BS/other regional publications.

Keywords

Integrated circuits, EMC, electromagnetic compatibility, LIN transceivers, LIN, ESD, RF immunity, conducted emissions, impulse immunity, IC test methods, automotive networks, test boards.

FAQ

Q: What is this standard?

A: IEC 62228-2:2016 is an International Standard that specifies EMC test and measurement methods for LIN transceiver integrated circuits (both stand-alone and embedded transceivers) under network operating conditions.

Q: What does it cover?

A: It covers test configurations, test conditions, test signals, failure criteria, procedures and setups for RF emission, RF immunity, impulse immunity and electrostatic discharge (ESD) testing of LIN transceiver ICs in realistic network-functional modes.

Q: Who typically uses it?

A: Semiconductor manufacturers, automotive IC designers, EMC test laboratories, product qualification teams and certification bodies use this standard to evaluate and document the EMC performance of LIN transceiver ICs.

Q: Is it current or superseded?

A: IEC 62228-2:2016 is the first edition (2016) and is published as an active International Standard; IEC lists its publication and stability information under the IEC catalogue (stability date information available from the IEC record). Users should check the IEC catalogue or their national standards body for any amendments or newer editions.

Q: Is it part of a series?

A: Yes — it is Part 2 of the IEC 62228 series (which also includes Part 1: General conditions and definitions, and Part 3: CAN transceivers). The series provides common general rules (Part 1) and transceiver-specific test requirements in separate parts.

Q: What are the key keywords?

A: Key keywords include: LIN transceiver, integrated circuit, EMC, electromagnetic compatibility, RF emission, immunity testing, impulse immunity, ESD, test board, automotive network.