IEC 62276-2025 PDF

Full title and description

IEC 62276:2025 — Single crystal wafers for surface acoustic wave (SAW) device applications — Specifications and measuring methods. This International Standard specifies requirements, sampling and test methods for synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO) and lanthanum gallium silicate (LGS) single‑crystal wafers used as substrates in the manufacture of SAW filters and resonators.

Abstract

IEC 62276:2025 (Edition 4.0) updates and consolidates dimensional, geometrical, surface, electrical and optical specifications and associated measurement methods for single‑crystal wafers used in SAW device production. Significant additions in this edition include extended terms and definitions, new technical requirements and sampling rules for LN and LT wafers (including transmittance, lightness and colour‑difference measurements), explicit definitions for inclusions, specification and sampling for LTV and PLTV parameters, tolerance on Curie temperature for LN/LT, and detailed measurement procedures for thickness, TV5, TTV, LTV and PLTV.

General information

• Status: Published — International Standard (active, valid from 7 March 2025).
• Publication date: 7 March 2025.
• Publisher: International Electrotechnical Commission (IEC), TC 49 (Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection).
• ICS / categories: 31.140 (Piezoelectric devices).
• Edition / version: Edition 4.0 (2025).
• Number of pages: 82 pages (English/French).

Key bibliographic details above are taken from the IEC publication record and distributor listings.

Scope

IEC 62276:2025 applies to the manufacture and acceptance of single‑crystal wafers of synthetic quartz, LN, LT, LBO and LGS intended as substrates for SAW filters and resonators. The standard covers dimensional tolerances, orientation flats, surface quality, roughness, warp, thickness uniformity and related parameters; it also defines sampling plans and test methods for verifying those requirements. New material‑specific properties and optical/electrical measurements for LN and LT are included to address industry needs for modern SAW device production.

Key topics and requirements

• Materials and wafer types: synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), lanthanum gallium silicate (LGS).
• Dimensional requirements: diameters, thicknesses and tolerances, orientation flats and secondary flats.
• Surface and geometry: front/back surface roughness, bevel, warp, TV5 (local thickness variation), TTV (total thickness variation), LTV and PLTV (local thickness variation metrics).
• Defects and inclusions: definitions, classification and acceptance criteria for front‑surface defects, inclusions, etch channels and electrical twins (quartz).
• Optical and electrical parameters for LN/LT: transmittance, lightness, colour difference, bulk resistivity (for reduced LN/LT) and Curie‑temperature tolerance.
• Sampling plans and acceptance criteria: specified sampling frequencies and procedures for lot inspection and testing.
• Test methods: measurement principles and methods for diameter, thickness, flats, TV5, TTV, LTV, PLTV, warp, surface defects, inclusions and optical metrics.

Typical use and users

Primary users are SAW device manufacturers (filters and resonators), wafer suppliers and processors, incoming quality control and test laboratories, procurement/specification engineers, and R&D teams developing piezoelectric substrates and SAW components. The standard is used to define supplier acceptance criteria, production quality control limits, and test procedures for wafer qualification.

Related standards

Related documents include earlier editions of the same standard (IEC 62276:2016 and IEC 62276:2012) and other IEC/ISO standards that address wafer measurements, piezoelectric materials and device testing. Users should check national adoptions (EN IEC versions) and companion technical reports from TC 49 for measurement guidance.

Keywords

SAW, surface acoustic wave, single crystal wafers, synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, lanthanum gallium silicate, TV5, TTV, LTV, PLTV, transmittance, lightness, colour difference, wafer specifications, test methods, IEC 62276.

FAQ

Q: What is this standard?

A: IEC 62276:2025 is an international standard that specifies requirements and measurement methods for single‑crystal wafers used as substrates in SAW device manufacturing (Edition 4.0, published 7 March 2025).

Q: What does it cover?

A: It covers material types (synthetic quartz, LN, LT, LBO, LGS), dimensional and geometrical tolerances, surface quality, thickness uniformity metrics (TV5, TTV, LTV, PLTV), optical/electrical parameters for LN/LT, sampling plans and detailed test methods.

Q: Who typically uses it?

A: SAW filter and resonator manufacturers, wafer suppliers, quality and test laboratories, procurement/specification engineers and researchers working on piezoelectric substrates and frequency control devices.

Q: Is it current or superseded?

A: IEC 62276:2025 is the current edition (Edition 4.0) valid from 7 March 2025 and replaces the previous edition (IEC 62276:2016). Users should verify national adoption dates where applicable.

Q: Is it part of a series?

A: Yes — it is the IEC series for single‑crystal wafer specifications for SAW devices (previous editions published in 2016 and earlier); it sits within TC 49’s portfolio of piezoelectric and frequency‑control device standards.

Q: What are the key keywords?

A: SAW, single crystal wafer, synthetic quartz, lithium niobate, lithium tantalate, TV5, TTV, LTV, PLTV, transmittance, lightness, colour difference, IEC 62276.