IEC 62624-2009 (IEEE Std 1650) PDF

Full title and description

IEC 62624:2009 — Test methods for measurement of electrical properties of carbon nanotubes. This publication is an adoption of IEEE Std 1650-2005 and provides recommended electrical characterization methods and standardized reporting practices for carbon nanotubes (CNTs), with particular attention to minimizing and characterizing measurement artifacts in high‑impedance measurements.

Abstract

IEC 62624:2009 defines test methods and reporting recommendations for the electrical measurement of single‑walled and multi‑walled carbon nanotubes. It identifies common sources of measurement error (especially for high‑impedance tests), gives recommended experimental practices to reduce or quantify artifacts, and promotes reproducible reporting so results can be compared across laboratories and along the research‑to‑manufacturing chain.

General information

• Status: Published / active international standard (adoption of IEEE Std 1650-2005).
• Publication date: 04 August 2009 (publication).
• Publisher: IEC (published as IEC 62624:2009) — adoption of IEEE Standard (IEEE Std 1650).
• ICS / categories: 07.030 (Physics/Chemistry); 07.120 (Nanotechnologies); 17.220.20 (Measurement of electrical and magnetic quantities).
• Edition / version: Edition 1.0 (2009) — adoption of IEEE Std 1650-2005.
• Number of pages: 17 pages.

Scope

Specifies recommended procedures for electrical characterization of carbon nanotubes that are independent of the processing route used to produce the CNTs. The standard addresses measurement set‑up, electrode/contact considerations, device‑level characterization, identification and mitigation of measurement artifacts (notably for high‑impedance testing), and standardized reporting to improve reproducibility and comparability of results.

Key topics and requirements

• Recommended test methods for electrical measurements of CNT materials and devices (resistance, conductivity, contact resistance, IV characterization).
• Guidance on electrode/contact fabrication and measurement fixtures to reduce contact artifacts and parasitic effects.
• Identification of common sources of measurement error for high‑impedance CNT tests and recommended practices to minimize or quantify those errors.
• Environmental and experimental reporting requirements (temperature, humidity, sample geometry, measurement equipment and settings) to support reproducibility.
• Standardized data presentation and reporting recommendations to enable inter‑laboratory comparison and technology uptake.

Typical use and users

Used by researchers, materials scientists, nanoelectronics device developers, test laboratories, metrology institutes, and manufacturers involved in CNT development and qualification. Typical applications include academic characterization studies, industrial R&D, quality control of CNT materials and devices, and inter‑laboratory comparisons.

Related standards

Directly related to and an adoption of IEEE Std 1650-2005. It complements other nanotechnology and measurement standards (for example IEC/ISO/TC work on nanotechnologies and measurement practice standards) that cover terminology, metrology and environmental controls for nanoscale materials.

Keywords

carbon nanotubes; CNT; electrical characterization; high‑impedance measurement; contact resistance; measurement artifacts; nanotechnology metrology; reporting practices.

FAQ

Q: What is this standard?

A: IEC 62624:2009 is an international standard that provides test methods and reporting recommendations for measuring the electrical properties of carbon nanotubes; it is an adoption of IEEE Std 1650-2005.

Q: What does it cover?

A: It covers recommended measurement procedures, contact/electrode guidance, sources of measurement error (especially for high‑impedance tests), environmental and equipment reporting requirements, and standardized ways to present results so that data are reproducible and comparable.

Q: Who typically uses it?

A: Researchers, academic and industrial R&D groups, test and calibration laboratories, metrology institutes, and manufacturers working with CNTs and nanoelectronic devices.

Q: Is it current or superseded?

A: IEC 62624:2009 was published on 4 August 2009 as an adoption of IEEE Std 1650-2005. The IEC webstore lists the publication details and stability information; users should check the IEC/IEEE catalogs for any amendments, revisions, or newer related standards before relying on it for current regulatory or procurement requirements.

Q: Is it part of a series?

A: It is a standalone measurement/test methods standard focused on electrical characterization of CNTs and is linked by adoption to IEEE Std 1650; it also sits within the broader landscape of IEC/ISO nanotechnology and metrology standards.

Q: What are the key keywords?

A: carbon nanotubes, CNT, electrical measurement, high‑impedance, contact resistance, measurement artifacts, nanotechnology metrology.