IEC 62899-503-1-2020 PDF
Name in English:
St IEC 62899-503-1-2020
Name in Russian:
Ст IEC 62899-503-1-2020
Original standard IEC 62899-503-1-2020 in PDF full version. Additional info + preview on request
Full title and description
Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor. This International Standard specifies a test method (displacement current measurement, DCM) intended for quality assessment of printed thin-film transistors (TFTs) and organic thin-film transistors (OTFTs).
Abstract
IEC 62899-503-1:2020 defines procedures and test conditions to measure displacement current in printed TFT devices as a means of assessing charge motion, dielectric behaviour and related device quality metrics. The standard describes measurement configurations, signal waveforms (e.g., triangular gate voltage), apparatus requirements, sample preparation and reporting conventions appropriate for printed electronics research, development and quality control.
General information
- Status: Current (published / in force).
- Publication date: 27 May 2020 (implemented date 27.05.2020; national registrations show June 2020 in some catalogues).
- Publisher: International Electrotechnical Commission (IEC), TC 119 Printed Electronics.
- ICS / categories: 29.045 (Semiconducting materials); 31.080.30 (Transistors).
- Edition / version: Edition 1.0 (2020).
- Number of pages: 15 pages (IEC edition; national/adopted formats may show different page counts for national publications).
Scope
Specifies a displacement current measurement (DCM) test method for printed thin-film transistors (TFTs) and organic TFTs (OTFTs) used in printed electronics. It sets out the measurement principle, required instrumentation and sample handling to identify charge motion and dielectric-related responses relevant to device quality assessment and comparison across samples and processes.
Key topics and requirements
- Definition of the displacement current measurement (DCM) technique for printed TFT/OTFT devices.
- Recommended test waveforms and excitation (e.g., triangular gate voltage) and timing parameters for DCM.
- Instrumentation and amplifier sensitivity requirements to resolve displacement currents in printed thin films.
- Sample preparation, environmental conditioning and test atmosphere references (normative references such as conditioning standards).
- Data acquisition, signal processing and reporting formats to support repeatable quality assessment.
- Interpretation guidance for displacement-current signatures related to charge trapping, dielectric losses and interface phenomena.
Typical use and users
Used by printed-electronics device manufacturers, process engineers, R&D groups, university research labs, contract test laboratories and quality/assurance teams to: evaluate TFT/OTFT quality during development and production, compare inks and dielectric stacks, diagnose charge trapping or leakage mechanisms, and establish measurement baselines for incoming inspection and process control.
Related standards
IEC 62899 is a multipart series covering printed electronics; related parts include other quality-assessment methods in the 503 subseries (for example IEC 62899-503-3:2021 for contact resistance by the transfer length method) and other 62899 parts addressing materials and device characterization (for example parts addressing semiconductor inks and sensor testing within the 62899 family).
Keywords
printed electronics, thin-film transistor (TFT), OTFT, displacement current measurement, DCM, quality assessment, device characterization, printed semiconductors, measurement method, TC 119.
FAQ
Q: What is this standard?
A: IEC 62899-503-1:2020 is an IEC International Standard that specifies a test method (displacement current measurement) for assessing printed thin-film transistors and organic TFTs used in printed electronics quality assessment.
Q: What does it cover?
A: It covers the displacement current measurement technique: measurement configurations, required instrumentation, test waveforms and parameters, sample handling, data acquisition and reporting to support repeatable evaluation of charge/dielectric behaviour in printed TFT devices.
Q: Who typically uses it?
A: Manufacturers of printed electronics, R&D and process development teams, academic researchers working on TFT/OTFT devices, contract test labs and quality assurance groups use this standard to evaluate device electrical behaviour and manufacturing quality.
Q: Is it current or superseded?
A: This edition (Edition 1.0) was published in May 2020 and is listed as current by IEC catalogues; IEC metadata shows a stability date for the publication (indicative lifecycle information used by IEC). Users should check national catalogues or IEC for any amendments or later related parts.
Q: Is it part of a series?
A: Yes — IEC 62899 is a multipart series on printed electronics (materials, device tests and quality assessment). Part 503 contains quality-assessment methods for printed TFTs; other related parts in the 62899 family address materials (e.g., semiconductor ink standards) and additional device test methods.
Q: What are the key keywords?
A: Displacement current measurement (DCM), printed TFT, OTFT, quality assessment, printed electronics, device characterization, dielectric measurement, TC 119.