IEC TR 61967-1-1-2015 PDF

Full title and description

Integrated circuits — Measurement of electromagnetic emissions — Part 1‑1: General conditions and definitions — Near‑field scan data exchange format. This Technical Report defines an XML‑based exchange format (Near‑Field Scan — NFS) for representing, storing and exchanging near‑field scan measurement and simulation data (emission and immunity) in the frequency and time domains. It specifies file structure, keywords, data notation, coordinate systems, probe factors and options for referencing images and 3D objects to enable interoperability between measurement systems, simulation tools and analysis/visualization software.

Abstract

IEC TR 61967‑1‑1:2015 provides a standardized data exchange format for near‑field scan results from integrated circuit (IC) measurements and simulations. The report documents XML syntax rules, a normative keyword set, data representation options (magnitude/angle, complex values, piece‑wise linear time/frequency data), provisions for separate binary data files, probe factor and transducer gain conventions (including complex values), coordinate system definitions and mechanisms for including images and 3D object references. Informative annexes give example files and usage cases to assist implementers.

General information

• Status: Published (Technical Report).
• Publication date: 28 August 2015.
• Publisher: International Electrotechnical Commission (IEC).
• ICS / categories: 31.200 (Integrated circuits; Electromagnetic compatibility).
• Edition / version: Edition 2.0 (2015).
• Number of pages: 63 pages.

Scope

The report defines an exchange file format for near‑field scan (NFS) data intended to be used for exchange between measurement instruments, computation/simulation tools and post‑processing/visualization software. It covers format syntax, keyword definitions, data notation, coordinate systems (Cartesian, cylindrical, spherical), probe factor and transducer gain conventions, support for time‑ and frequency‑domain data (including piece‑wise linear representations), handling of binary data files and references to images and 3D objects. It does not prescribe measurement or simulation methods, nor processing algorithms or viewer implementations.

Key topics and requirements

• XML‑based file structure and general syntax rules (root elements, sections, case sensitivity and keyword conventions).
• Normative keyword list and rules for parent/child relationships, numeric and unit syntax, and allowed character sets.
• Data representation options: magnitude/angle, complex values, ASCII lists and separate binary (IEEE 754 binary32) data files.
• Coordinate system definitions, offsets, rotation vectors and mapping between measurement and device reference planes (Vx, Vy, Vz, Target keywords).
• Probe factor and transducer gain rules, including support for complex probe factors and explicit units.
• Support for images and 3D object references for visualization (Object3d, Mapobj keywords) and file/path conventions for portability.
• Keywords to support multi‑file datasets, max‑hold and data source/software metadata (Datafileformat, Data_source, Software, Maxhold).
• Annex examples demonstrating minimum files, emission/immunity cases, data with/without coordinates and multi‑file arrangements.

Typical use and users

EMC/EMI test engineers, near‑field scanner manufacturers, EDA and simulation tool vendors, laboratory data managers and R&D teams use this Technical Report to standardize exchange of near‑field scan data. Typical uses include exporting measurement results for visualization and correlation with simulation, archiving standardized datasets, transferring data between test systems and analysis software, and enabling interoperability between vendors' tools.

Related standards

The publication is part of the IEC 61967 series for measurement of electromagnetic emissions from integrated circuits. Closely related documents include IEC 61967‑1 (general conditions and definitions for integrated‑circuit emissions), other parts of IEC 61967 (measurement methods for radiated and conducted emissions, magnetic probe methods, etc.) and referenced standards such as ISO 8879 (SGML) and IEEE Std 754 (binary32 floating point format) used for binary data interchange.

Keywords

Near‑field scan (NFS), XML exchange format, integrated circuits, electromagnetic emissions, EMC, EMI, probe factor, transducer gain, datafileformat, 3D object, Image mapping, piece‑wise linear, time‑domain, frequency‑domain, keywords, coordinate systems, interoperability.

FAQ

Q: What is this standard?

A: IEC TR 61967‑1‑1:2015 is a Technical Report that defines an XML‑based data exchange format for near‑field scan measurement and simulation data associated with integrated‑circuit electromagnetic emission and immunity testing.

Q: What does it cover?

A: It specifies file structure and syntax, a normative set of keywords and their semantics, data representation options (ASCII and binary), coordinate system and probe‑factor conventions, and mechanisms for referencing images and 3D objects. It includes informative annexes with example files.

Q: Who typically uses it?

A: EMC/EMI test laboratories, IC test and measurement equipment vendors, EDA and simulation software developers, and engineers working on emission debugging, visualization and correlation between measured and simulated near‑field data.

Q: Is it current or superseded?

A: This is the 2015 edition (Edition 2.0). It replaced the 2010 edition and, as published, remains the IEC Technical Report for the NFS exchange format. The IEC listing shows a stability date indicating expected currency through 2028; users should check IEC publication records for any corrigenda or newer editions if absolute current status is required.

Q: Is it part of a series?

A: Yes. It is part of the IEC 61967 series (measurement of electromagnetic emissions of integrated circuits). Other parts of the series address specific measurement methods (radiated and conducted emissions, probe methods, etc.) and related general conditions.

Q: What are the key keywords?

A: Important keywords defined in the report include EmissionScan, ImmunityScan (root elements), Component, Setup, Probe, Data, Frequencies, Unit, Datafileformat, Object3d, Mapobj, Maxhold, ProbeFactor, Vx, Vy, Vz, Target, Software and Data_source. These control structure, metadata and data referencing within NFS files.