IEC TR 62632-2013 PDF

Full title and description

IEC TR 62632:2013 — Nanoscale electrical contacts and interconnects. This technical report surveys types of nanoscale contacts and nano-interconnects used in research and commercial products, describes fabrication and characterization methods, discusses performance and reliability issues, and provides recommendations to designers and researchers working with nano-enabled electrical and electronic products.

Abstract

IEC TR 62632:2013 is a technology‑survey technical report produced by IEC TC 113 that identifies common nanoscale contact and interconnect technologies (for example carbon nanotubes, nanowires, graphene contacts, organic and magnetic nanoscale contacts), summarizes their configurations and product requirements, reviews fabrication and process controls, outlines characterization and metrology approaches, assesses functionality and reliability, and gives guidance and recommendations for product designers and researchers. The report is intended as a technology‑neutral reference to support development and standardization of nano‑enabled electrotechnical products.

General information

• Status: Withdrawn (publication later archived; IEC withdrawal date recorded as 31 March 2025).
• Publication date: 25 September 2013 (IEC TR 62632:2013).
• Publisher: International Electrotechnical Commission (IEC), prepared by Technical Committee TC 113 (Nanotechnology for electrotechnical products and systems).
• ICS / categories: 07.030 (Physics. Chemistry) and 07.120 (Nanotechnologies).
• Edition / version: Edition 1.0 (first edition, 2013).
• Number of pages: 36 pages (IEC base publication). Note: some national publications/adoptions (PD/DIN/BSI variants) list minor pagination differences (e.g., 40 pages in certain national PDF products).

Scope

This technical report surveys the state of the art for nanoscale electrical contacts and nano‑interconnects used in R&D and present‑day products. For each type of nanoscale contact/interconnect the report describes: typical type and configuration; product requirements and functional expectations; fabrication technologies, processes and process controls; characterization and metrology techniques; observed performance and reliability issues; and anticipated market readiness. The report highlights positive and negative characteristics of the technologies and provides recommendations to support design, manufacture and future standardization.

Key topics and requirements

• Overview of nanoscale contact types and configurations (carbon nanotubes, nanowires, graphene, organic nanoscale contacts, magnetic nanoscale contacts, etc.).
• Product interface and functional requirements for nanoscale contacts and interconnects (electrical, thermal, mechanical considerations).
• Fabrication technologies and process‑control considerations for reproducible nano‑contact formation.
• Characterization and metrology: electrical measurements, morphological imaging, and reliability testing methods appropriate to nanoscale interfaces.
• Performance and reliability challenges (contact resistance, stability, degradation mechanisms, manufacturing yield implications).
• Market readiness and recommended practices to accelerate commercialization and support standardization activities.

Typical use and users

Primary users are product designers, electronics/materials engineers, R&D teams, process engineers, metrology and test laboratories, and standards developers working on nano‑enabled electronic, photonic or sensing products. Typical applications include nanoscale interconnects in advanced ICs, nanoscale electrodes for sensors and optoelectronics, CNT/graphene contact implementations, printable and flexible electronics, and evaluation of nanoscale interfaces for batteries, PV and solid‑state lighting.

Related standards

IEC TR 62632 references and complements other nanotechnology vocabulary and terminology documents such as ISO/TS 27687:2008 (terminology and definitions for nano‑objects) and the ISO/IEC 80004 series (nanotechnologies — vocabulary). It was prepared within IEC TC 113 and complements other TC 113 deliverables on nanomanufacturing, measurement and reliability. National adoptions (PD/DIN/BSI) exist for this TR.

Keywords

nanotechnology; nanoscale contact; nano‑interconnect; nanotube; nanowire; graphene contact; fabrication; characterization; metrology; reliability; IEC TC 113.

FAQ

Q: What is this standard?

A: IEC TR 62632:2013 is a Technical Report from the International Electrotechnical Commission (IEC) that surveys nanoscale electrical contacts and interconnect technologies and provides guidance and recommendations for designers, researchers and standards developers.

Q: What does it cover?

A: It covers types and configurations of nanoscale contacts/interconnects, product requirements, fabrication methods and process controls, characterization and metrology techniques, performance and reliability issues, and market readiness and recommendations for use.

Q: Who typically uses it?

A: Product designers, R&D engineers, materials and process engineers, test and metrology laboratories, manufacturers of nano‑enabled components, and standards developers (especially those active in IEC TC 113).

Q: Is it current or superseded?

A: The IEC webstore records IEC TR 62632:2013 as withdrawn; the withdrawal date is listed as 31 March 2025. There is no widely published single replacement standard indicated in the IEC record; users seeking the most current normative guidance should consult IEC TC 113 work items and the IEC webstore or national adoption bodies for updates or successor documents.

Q: Is it part of a series?

A: It was prepared by IEC TC 113 and sits alongside other TC 113 publications and ISO/IEC vocabulary documents (for example ISO/TS 27687 and the ISO/IEC 80004 series). It functions as a technology survey TR rather than a prescriptive series‑part standard.

Q: What are the key keywords?

A: Nanotechnology; nanoscale contact; nano‑interconnect; nanotube; nanowire; graphene; characterization; metrology; reliability; TC 113.