IEC TS 62607-2-5-2022 PDF

Full title and description

Nanomanufacturing - Key control characteristics - Part 2-5: Carbon nanotube materials - Mass density of vertically-aligned carbon nanotubes: X-ray absorption method. This IEC Technical Specification defines standardized protocols, experimental procedures, data formats and illustrative case studies for determining the mass density of vertically‑aligned carbon nanotube (VACNT) films using an X‑ray absorption method; it is targeted at VACNT films with thicknesses larger than several tens of micrometres and does not limit substrate materials.

Abstract

This Technical Specification (IEC TS 62607-2-5:2022) gives a repeatable, documented method to measure the mass density of vertically‑aligned carbon nanotube (VACNT) films by X‑ray absorption. It covers recommended sample preparation, measurement geometry and instrument settings, data analysis and reporting formats, uncertainty considerations and example case studies to support routine quality control and comparability between laboratories.

General information

• Status: Published
• Publication date: 8 November 2022
• Publisher: IEC (International Electrotechnical Commission)
• ICS / categories: 07.030; 07.120
• Edition / version: Edition 1.0
• Number of pages: 20

(Metadata as registered with the IEC webstore for IEC TS 62607-2-5:2022).

Scope

Specifies an X‑ray absorption based measurement protocol to determine the mass density of vertically‑aligned carbon nanotube films grown on substrates. The method is intended for VACNT films with thicknesses greater than several tens of micrometres and is written so that substrate material does not restrict applicability. The document includes experimental procedures, recommended data formats, example data and case studies to aid implementation and interlaboratory comparability.

Key topics and requirements

• Definition of the key control characteristic (mass density) for VACNT films.
• Recommended sample preparation and handling for X‑ray absorption measurements.
• Measurement geometry, instrument settings and calibration procedures appropriate for X‑ray absorption on VACNT/substrate bilayers.
• Data acquisition, correction (background and substrate effects) and analysis approaches to derive mass density from absorption data.
• Estimation and reporting of measurement uncertainty and repeatability.
• Standardized data formats and reporting templates to support comparability and traceability.
• Illustrative case studies and examples showing typical results and pitfalls.
• Notes on applicability limits (film thickness regime) and considerations for different substrate types.

Typical use and users

This Technical Specification is intended for metrology laboratories, R&D groups, production quality engineers and material suppliers involved with VACNT synthesis and characterization. Typical uses include process control and batch acceptance testing of VACNT films, interlaboratory studies, development of in‑house measurement procedures aligned to an international reference, and provision of material datasheets with a traceable mass density value.

Related standards

IEC TS 62607 is a multi‑part series titled "Nanomanufacturing — Key control characteristics." Relevant related parts and documents in the series (examples) include other VACNT and carbon‑based material methods such as Part 2-6 (Thermal diffusivity of VACNTs — flash method), and multiple Parts addressing graphene, luminescent nanomaterials and nano‑electrode materials in the 62607 family. These complementary parts cover other key control characteristics and measurement techniques used in nanomanufacturing quality control.

Keywords

VACNT, vertically‑aligned carbon nanotubes, mass density, X‑ray absorption, nanomanufacturing, key control characteristic, TC 113, metrology, measurement protocol, IEC TS 62607-2-5:2022

FAQ

Q: What is this standard?

A: IEC TS 62607-2-5:2022 is a Technical Specification from the IEC 62607 series that provides a standardized X‑ray absorption method to measure the mass density of vertically‑aligned carbon nanotube films.

Q: What does it cover?

A: It covers recommended sample preparation, measurement geometry and instrument settings, data correction and analysis methods, uncertainty estimation, reporting formats and case studies specific to VACNT films thicker than several tens of micrometres.

Q: Who typically uses it?

A: Users include materials and metrology laboratories, researchers in carbon nanotube synthesis, manufacturers and quality engineers who need a repeatable method to characterise and control VACNT film density.

Q: Is it current or superseded?

A: The document was published on 8 November 2022 and is listed as Published by the IEC; it remains the active Technical Specification until reviewed at its stability/review date (as recorded by IEC). Consult the IEC webstore or national mirror for the latest status if a change is suspected.

Q: Is it part of a series?

A: Yes — it is one part of the IEC 62607 "Nanomanufacturing — Key control characteristics" series. The series contains multiple parts addressing measurement methods for different nanomaterials and properties (density, thermal transport, optical properties, electronic properties, etc.).

Q: What are the key keywords?

A: VACNT, carbon nanotubes, mass density, X‑ray absorption, nanometrology, nanomanufacturing, measurement protocol, IEC TS 62607.