IEEE Std 1450.6-2005 (2011) PDF

Full title and description

IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data — Core Test Language (CTL). This standard defines the Core Test Language (CTL), an extension to STIL, to represent core context, wrapper information, and integration details needed to reuse digital test vector data for cores within system-on-chip (SoC) environments. It provides language constructs and semantic rules to enable interoperability among core providers, system integrators, and EDA tool vendors.

Abstract

Defines CTL constructs to describe core-level test information (signals, modes, wrapper and internal test structures) and the mapping needed to reuse existing core test vectors when cores are integrated into larger SoC designs. CTL is intended to be consistent with STIL and to support IEEE Std 1500 for wrapped and unwrapped cores, enabling transportable and tool‑friendly descriptions of core test data.

General information

• Status: Inactive—Reserved (standard was reaffirmed in 2011 and later inactivated).
• Publication date: Originally published April 5, 2006 (IEEE Std 1450.6-2005); reaffirmed June 16, 2011; later inactivated March 24, 2022.
• Publisher: IEEE / IEEE Computer Society.
• ICS / categories: Information technology / test and test language (languages used in information technology; test, instrumentation and measurement).
• Edition / version: IEEE Std 1450.6-2005 (reaffirmed 2011).
• Number of pages: Approximately 120 pages.

Scope

This standard addresses the needs of SoC test reuse by specifying a language (CTL) for describing the context of a core and how that core is integrated into a larger system. CTL provides constructs to represent externally visible signals, test modes/configurations, core-internal test structures, wrapper information for wrapped/unwrapped cores, and links to other test data representations (to allow inclusion of legacy test formats). The scope is limited to digital interfaces and to core-centric descriptions that facilitate automated test generation and interoperability among providers, integrators, and tools.

Key topics and requirements

• Language constructs for core context: signals, ports, and test modes (test configurations).
• Wrapper and wrapper-specific information to support wrapped and unwrapped cores consistent with IEEE Std 1500.
• Semantic rules to ensure consistent interpretation across core providers, system integrators, and EDA tools.
• Support for linking or embedding legacy test data representations while using STIL syntax as preferred bulk format.
• Constructs to describe internal test structures and their reuse for testing logic external to the core.
• Extensions and profiles that allow future memory- and compression-related enhancements (later standards expand memory modeling and compression descriptions).

Typical use and users

Used by core/IP providers to supply reusable test descriptions, by system integrators to integrate core test vectors into SoC-level test flows, and by EDA vendors who implement tools for pattern translation, test generation, and automation. Typical users include test engineers, design-for-test (DFT) teams, IP integrators, and tool developers working on SoC test flows.

Related standards

Closely related to IEEE Std 1450 (STIL) and IEEE Std 1500 (Testability Method for Embedded Core-based ICs). Follow-on and related documents include IEEE 1450.6.1 (describing on‑chip scan compression information) and IEEE 1450.6.2 (memory modeling extensions to CTL). Also interoperates with other test and access standards such as IEEE 1149.x families where applicable.

Keywords

Core Test Language, CTL, STIL, test vector data, SoC test, core wrapper, test reuse, IEEE 1450.6, IEEE 1500, test automation, DFT, IP test description.

FAQ

Q: What is this standard?

A: IEEE Std 1450.6-2005 defines the Core Test Language (CTL), an extension to STIL, for representing core-level digital test vector data and the integration context needed to reuse those vectors in SoC environments.

Q: What does it cover?

A: It covers language constructs and semantic rules to describe core signals, test modes, wrapper information (for wrapped and unwrapped cores), and mappings needed for test reuse and interoperability between core providers, system integrators, and EDA tools. It focuses on digital interfaces and SoC integration scenarios.

Q: Who typically uses it?

A: IP/core providers, SoC system integrators, DFT and test engineers, and EDA tool vendors implementing pattern translation, test generation, or automation features for SoC testing.

Q: Is it current or superseded?

A: IEEE Std 1450.6-2005 was published in 2006 and reaffirmed in 2011; the IEEE record shows it later became Inactive‑Reserved (inactivated on March 24, 2022). Complementary and extension work (for example 1450.6.1 and 1450.6.2) followed to address on-chip compression and memory modeling. Users should check current IEEE activity for newer revisions or replacements before adopting it for new projects.

Q: Is it part of a series?

A: Yes — it is part of the IEEE 1450 series (STIL extensions and CTL-related documents) and is intended to work with IEEE Std 1500 for embedded core testability; subsequent related parts include 1450.6.1 and 1450.6.2.

Q: What are the key keywords?

A: Core Test Language (CTL), STIL, core wrapper, SoC test, test reuse, test vector, IP test, DFT, IEEE 1450.6.