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Semiconductor devices. Micro-electromechanical devices - Axial fatigue testing methods of thin film materials. Original standard BS EN 62047-6-2010 in PDF full version. Additional info + preview on request

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Semiconductor devices. Micro-electromechanical devices - MEMS BAW filter and duplexer for radio frequency control and selection. Original standard BS EN 62047-7-2011 in PDF full version. Additional info + preview on request

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Semiconductor devices. Micro-electromechanical devices - Strip bending test method for tensile property measurement of thin films. Original standard BS EN 62047-8-2011 in PDF full version. Additional info + preview on request

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Semiconductor devices. Micro-electromechanical devices - Wafer to wafer bonding strength measurement for MEMS. Original standard BS EN 62047-9-2011 (2012) in PDF full version. Additional info + preview on request

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Electricity metering equipment (AC). Particular requirements - Symbols. Original standard BS EN 62053-52-2005 in PDF full version. Additional info + preview on request

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Electricity metering equipment (a.c.). Particular requirements - Power consumption and voltage requirements. Original standard BS EN 62053-61-1999 in PDF full version. Additional info + preview on request

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