IEC 62884-1-2017 PDF

Full title and description

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 1: Basic methods for the measurement. This part defines the basic measurement methods and general measurement techniques applicable to piezoelectric, dielectric and electrostatic oscillators (including dielectric resonator oscillators (DROs) and oscillators using thin-film bulk acoustic resonators (FBAR)).

Abstract

IEC 62884-1:2017 provides foundational measurement principles, definitions and recommended basic procedures for characterizing oscillators based on piezoelectric, dielectric and electrostatic resonators. It establishes the basic measurement environment and approaches that test laboratories and manufacturers can use as the basis for more specific measurement methods and subsequent parts of the series.

General information

• Status: Published / Active
• Publication date: 8 June 2017
• Publisher: International Electrotechnical Commission (IEC)
• ICS / categories: 31.140 — Piezoelectric devices
• Edition / version: Edition 1.0 (2017)
• Number of pages: 61 (base IEC publication)

Bibliographic details from the IEC publication record.

Scope

Specifies basic methods for the measurement of piezoelectric, dielectric and electrostatic oscillators. The standard covers general measurement techniques and arrangements applicable to a range of oscillator types (including DROs and FBAR-based oscillators), and it serves as the foundational part of the IEC 62884 series on measurement methods. It is intended to harmonize terminology, basic test arrangements and general measurement practices before applying more specialized procedures (for example, phase-jitter/phase-noise methods) in later parts.

Key topics and requirements

• Definitions and terminology for oscillators and resonators used in measurement (piezoelectric, dielectric, electrostatic, DRO, FBAR).
• Basic measurement parameters and objectives (resonant frequency/frequency readout, Q-factor, output level, basic spectral characterization).
• General test arrangements and instrumentation guidance (preferred measurement set-ups, reference connections and coupling considerations for reliable measurements).
• Environmental and mounting considerations (temperature control, mechanical mounting and vibration avoidance) to ensure repeatability.
• Calibration and uncertainty management: basic guidance on calibration, repeatability and traceability for the measurements described.
• Normative references and pointers to more-specialized methods (e.g., phase-jitter/noise measurement methods in other parts of the series).

Key topical scope derived from the IEC descriptive summary and standard metadata.

Typical use and users

Used by test and calibration laboratories, RF and frequency-control engineers, manufacturers of oscillators and resonators (piezoelectric, dielectric and FBAR-based), and standards/quality engineers who need a common baseline for measurement practice. The standard is a starting point for laboratories developing test procedures and for product developers validating oscillator performance under controlled conditions.

Related standards

IEC 62884 is a multipart series. Notably, IEC 62884-2:2017 covers phase-jitter (phase-noise) measurement methods for the same classes of oscillators and provides the specialized procedures for jitter/noise characterization; users typically apply Part 1 as the general foundation and Part 2 when measuring phase jitter/phase noise. National and regional adoptions (EN, national bodies) exist for the parts of the series.

Keywords

oscillator measurement, piezoelectric oscillator, dielectric resonator oscillator (DRO), FBAR, phase jitter, phase noise, frequency stability, Q-factor, TC 49, metrology, measurement techniques

FAQ

Q: What is this standard?

A: IEC 62884-1:2017 is the first part of an IEC multipart standard that defines basic measurement methods for piezoelectric, dielectric and electrostatic oscillators.

Q: What does it cover?

A: It covers foundational measurement techniques, general test arrangements, terminology and basic procedural guidance intended to produce repeatable, comparable measurements for the oscillator types in its scope. More-specialized measurements (for example, detailed phase-noise/jitter procedures) are addressed in subsequent parts.

Q: Who typically uses it?

A: Test laboratories, oscillator/resonator manufacturers, RF and frequency-control engineers, and standards or quality engineers who develop or verify oscillator measurement procedures.

Q: Is it current or superseded?

A: IEC 62884-1:2017 was published on 8 June 2017 and is listed as the current base publication (Edition 1.0) with the IEC publication record indicating stability into 2026; users should check their national body or the IEC webstore for any amendments or later revisions after the stated stability date.

Q: Is it part of a series?

A: Yes. IEC 62884 is a multipart series; Part 1 gives the basic measurement methods and Part 2 (IEC 62884-2:2017) specifies the phase-jitter/phase-noise measurement method. Additional parts or national adoptions may exist for related, specialized measurement procedures.

Q: What are the key keywords?

A: Oscillator measurement, piezoelectric oscillator, dielectric resonator, FBAR, phase jitter, phase noise, frequency stability, Q-factor, measurement method.