IEC 62884-2-2017 PDF

Full title and description

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators — Part 2: Phase jitter measurement method (IEC 62884-2:2017). This part specifies methods for the measurement and evaluation of phase jitter (RMS jitter) of piezoelectric, dielectric and electrostatic oscillators (including dielectric resonator oscillators and oscillators using thin-film bulk acoustic resonators), and gives guidance on instrumentation and procedures to obtain accurate RMS jitter results using phase-noise/phase-jitter measurement systems.

Abstract

IEC 62884-2:2017 defines a standardized phase-jitter measurement method for oscillators used in frequency-control and selection applications. It describes required test setup, measurement equipment (phase-noise measurement systems), signal processing and integration approaches to derive RMS phase jitter, plus guidance on reporting and uncertainty assessment so that results are reproducible between laboratories and manufacturers.

General information

• Status: International Standard (published)
• Publication date: 30 August 2017
• Publisher: International Electrotechnical Commission (IEC)
• ICS / categories: 31.140 (Piezoelectric and dielectric devices; measurement of electrical and magnetic quantities)
• Edition / version: Edition 1.0 (2017)
• Number of pages: 24

Scope

This part of IEC 62884 specifies the measurement and evaluation method for phase jitter of piezoelectric, dielectric and electrostatic oscillators — including DIELECTRIC RESONATOR OSCILLATORS (DROs) and oscillators using FBAR technology — using phase-noise / phase-jitter measurement equipment and defined measurement procedures. It provides the definitions, test conditions, measurement bandwidths and processing steps required to calculate RMS jitter and to report results with appropriate uncertainty. The document is published as an IEC international standard and has been adopted as EN 62884-2:2017 for use in CENELEC member countries.

Key topics and requirements

• Definition of phase jitter and relationship to phase noise (terminology and units).
• Required measurement equipment and system-level configuration (phase-noise analyzers, reference sources, mixers, PLLs, etc.).
• Recommended test setups for different oscillator types (piezoelectric, dielectric, electrostatic, DRO, FBAR).
• Signal conditioning, measurement bandwidths and integration limits for converting phase noise to RMS jitter.
• Procedures for measurement sequence, averaging, and data processing to obtain reproducible RMS jitter values.
• Uncertainty considerations and reporting format for test results (what to declare with the measurement).
• Guidance on calibration, environmental and supply conditions that affect jitter measurements.

Typical use and users

Used by oscillator component manufacturers, frequency-control design engineers, test and characterization laboratories, quality assurance teams and procurement/specification authors who need repeatable, comparable measurements of phase jitter. The standard helps design verification, production test planning, supplier acceptance testing and laboratory intercomparisons.

Related standards

IEC 62884-1:2017 (Part 1 — Basic measurement methods) provides the foundational measurement techniques and terms that complement Part 2. IEC 60679-1 (generic specification for piezoelectric, dielectric and electrostatic oscillators) is related: measurement methods for oscillator performance have been organized across the IEC 62884 series and IEC 60679 family. The EN version (EN 62884-2:2017) reflects European adoption of IEC 62884-2:2017.

Keywords

phase jitter; phase noise; RMS jitter; oscillator measurement; piezoelectric oscillator; dielectric resonator oscillator (DRO); FBAR; measurement techniques; IEC 62884-2; test method; phase-noise analyzer.

FAQ

Q: What is this standard?

A: IEC 62884-2:2017 is an international standard that specifies a phase-jitter measurement method for piezoelectric, dielectric and electrostatic oscillators, giving procedures to measure and report RMS jitter reproducibly.

Q: What does it cover?

A: It covers instrumentation and test setups, definitions, measurement bandwidths and data-processing steps needed to convert phase-noise measurements into RMS phase jitter, plus guidance on uncertainty, calibration and reporting.

Q: Who typically uses it?

A: Oscillator manufacturers, design engineers, test laboratories, QA and compliance teams, and procurement/specification writers who require consistent, comparable jitter data for components and subsystems.

Q: Is it current or superseded?

A: The publication edition is 1.0 (2017). IEC lists the document with a stability date through 2026; users should check national adoption or later amendments/corrigenda for updates in their region.

Q: Is it part of a series?

A: Yes — IEC 62884 is a multipart series on measurement techniques for piezoelectric, dielectric and electrostatic oscillators. Part 1 covers basic measurement methods (IEC 62884-1:2017) while Part 2 covers the phase jitter method described here; other related IEC documents cover specifications and complementary measurements.

Q: What are the key keywords?

A: Phase jitter, phase noise, RMS jitter, oscillator measurement, DRO, FBAR, piezoelectric oscillator, measurement uncertainty, phase-noise analyzer.