IEC 63202-1-2019 PDF

Full title and description

Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells. This international standard specifies procedures for measuring light‑induced degradation (LID) of crystalline silicon PV cells using simulated sunlight; LID magnitude is determined by comparing maximum output power at Standard Test Conditions (STC) before and after specified light exposure to help manufacturers minimise cell mismatch and maximise module power yield.

Abstract

IEC 63202-1:2019 provides a standardized test procedure and parameter settings for conditioning and measuring initial light‑induced degradation (LID) of crystalline silicon photovoltaic cells in simulated sunlight. The standard addresses experimental factors (irradiance, temperature, exposure dose and measurement at STC) necessary to obtain consistent, comparable LID results for cell quality assessment and production monitoring.

General information

• Status: Published / Active international standard.
• Publication date: 20 June 2019.
• Publisher: International Electrotechnical Commission (IEC), TC 82 (Solar photovoltaic energy systems).
• ICS / categories: 27.160 (Solar energy engineering).
• Edition / version: Edition 1.0 (2019).
• Number of pages: 17 pages.

Scope

IEC 63202-1:2019 specifies procedures for measuring the light‑induced degradation of crystalline silicon photovoltaic cells under simulated sunlight. It defines the conditioning exposures, measurement methods and reporting at Standard Test Conditions (STC) required to quantify initial LID and to characterise the distribution of post‑LID output across cell batches. The standard is intended to support cell and module manufacturers, test laboratories and quality assurance activities by providing consistent LID information that complements PV module LID measurements.

Key topics and requirements

• Definition and measurement of light‑induced degradation (LID) for crystalline silicon PV cells using simulated sunlight.
• Conditioning procedures (specified irradiance, temperature and exposure dose) prior to final STC measurement.
• Comparison of maximum output power (Pmp) at STC before and after light exposure as the primary metric for LID.
• Guidance on parameter settings and test sequencing to improve repeatability and reduce variability between labs and production lines.
• Notes on interpretation: LID magnitude is one indicator of cell quality but should not be used alone; distributions of stabilized current and power are also important for module performance.

Typical use and users

Used by PV cell manufacturers, module manufacturers, independent test laboratories, certification bodies and R&D teams. Typical applications include production process control, incoming cell inspection, R&D evaluation of cell technologies (e.g., PERC vs N‑type), and supporting module performance and warranty assessments. Test labs use the standard to produce comparable LID metrics for qualification and quality assurance.

Related standards

IEC 63202-1 complements and is referenced alongside existing PV measurement standards: IEC 60904 series (I‑V measurements and STC definitions) and IEC 61215 series (module qualification tests and module LID procedures); it is part of the broader IEC 63202 family that also covers elevated‑temperature/light (LETID) measurements (for example IEC TS 63202-4:2022). Regional/adopted versions exist under EN/BS/other national adoptions (EN IEC 63202-1:2019 and equivalent national adoptions).

Keywords

Light‑induced degradation (LID), photovoltaic cells, crystalline silicon, STC (Standard Test Conditions), simulated sunlight, conditioning, TC 82, PV test methods, cell quality, LETID.

FAQ

Q: What is this standard?

A: IEC 63202-1:2019 is an international standard that specifies how to measure initial light‑induced degradation (LID) of crystalline silicon photovoltaic cells using simulated sunlight and reporting at Standard Test Conditions.

Q: What does it cover?

A: It covers conditioning exposures, measurement procedures, parameter settings (irradiance, temperature, exposure dose) and reporting required to determine the magnitude of LID (change in maximum output power at STC) and to characterise the distribution of post‑LID cell performance.

Q: Who typically uses it?

A: PV cell and module manufacturers, independent test laboratories, certification bodies, and R&D teams use the standard for production monitoring, product qualification, and comparative evaluation of cell technologies.

Q: Is it current or superseded?

A: IEC 63202-1:2019 is the first edition published 20 June 2019 and is listed as an active publication; subsequent related technical specifications (for example IEC TS 63202-4:2022 on LETID) have been published to address additional degradation phenomena, but IEC 63202-1:2019 remains the reference for initial LID measurements. Users should check national/adopted publications for any later amendments or revisions.

Q: Is it part of a series?

A: Yes — IEC 63202 is a family addressing PV cell degradation measurement topics. Part 1 covers initial LID of crystalline silicon cells; other parts/technical specifications in the series address related phenomena such as elevated‑temperature light‑induced degradation (LETID). The work is produced under IEC TC 82.

Q: What are the key keywords?

A: Key keywords are: light‑induced degradation (LID), photovoltaic cell, crystalline silicon, simulated sunlight, STC, conditioning, TC 82, measurement procedure.