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Yttrium, lanthanum, ytterbium, lutetium and their oxides. Chemical-spectral method of determination of impurities of vanadium, tungsten, iron, cobalt, manganese, copper, molybdenum, nickel, niobium, lead, tantalum, titanium and chromium
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Knife clips and adjusting plates for cutter bars of agricultural machines
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Environmental labels and declarations. Principles, requirements and guidelines for communication of footprint information
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Epitaxial structures. Ðœethod for measuring the thickness of epitaxial silicon layers in structures of the silicon-on-sapphire type based on IR interference
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State system for ensuring the uniformity of measurements. Convex spherical mirrors. Measurement technique of curvature radius and local departures of surfaces forms from sphericity by holographic shear interferometry
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Footwear. Performance requirements for components for footwear. Insoles
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