GOST R 54162-2010

Semiconductor emitters. Methods of measurement for relative spectral energy distribution and spectral bandwidth

Electromagnetic compatibility of technical equipment. Limitation of emission of harmonic currents in low-voltage power supply systems for equipment with rated current greater than 16 A. Limits and test methods

Ionizing radiation measuring means. General specifications

Ophthalmic optics. Metal and combination spectacle frames. Method for the simulation of wear and detection of nickel release

Raw uncured makhorka (kind of shag). Specification

Printed boards and printed board assemblies. Design and use. Part 5-5. Attachment (land/joint) considerations. Components with gull-wing leads on four sides