Moldova standards PDF

Semiconductor devices - Part 1- Time-dependent dielectric breakdown (TDDB) test for inter-metal layers. IEC 62374-1-2010. Original standard IEC 62374-1-2010 in PDF full version. Additional info + preview on request

Document status: Active

Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films. IEC 62374-2007. Original standard IEC 62374-2007 in PDF full version. Additional info + preview on request

Document status: Active

Video systems (625 50 progressive) - Video and accompanied data using the vertical blanking interval - Analogue interface. IEC 62375-2004. Original standard IEC 62375-2004 in PDF full version. Additional info + preview on request

Document status: Active

Maritime navigation and radiocommunication equipment and systems - Electronic chart system (ECS) - Operational and performance requirements, methods of testing and required test results. IEC 62376-2010. Original standard IEC 62376-2010 in PDF full version. Additional info + preview on request

Document status: Withdrawn

Common control interface for networked digital audio and video products - Part 1- General. IEC 62379-1-2007. Original standard IEC 62379-1-2007 in PDF full version. Additional info + preview on request

Document status: Active

Common control interface for networked digital audio and video products - Part 2- Audio. IEC 62379-2-2008-09(en-fr). Original standard IEC 62379-2-2008 in PDF full version. Additional info + preview on request

Document status: Active