Moldova standards PDF

Standard Practice for Determination of Uniformity of Thin Films on Silicon Wafers (Withdrawn 2003). Original standard ASTM F1618-02 in PDF full version. Additional info + preview on request

Document status: Withdrawn

Standard Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle (Withdrawn 2003). Original standard ASTM F1619-95 (2000)e1 in PDF full version. Additional info + preview on request

Document status: Withdrawn

Standard Practice for Calibrating a Scanning Surface Inspection System Using Monodisperse Polystyrene Latex Spheres Deposited on Polished or Epitaxial Wafer Surfaces (Withdrawn 2003). Original standard ASTM F1620-96 in PDF full version. Additional info + preview on request

Document status: Withdrawn

Standard Practice for Determining the Positional Accuracy Capabilities of a Scanning Surface Inspection System (Withdrawn 2003). Original standard ASTM F1621-96 in PDF full version. Additional info + preview on request

Document status: Withdrawn

Test Method for Measuring the Torsional Properties of Metallic Bone Screws (Withdrawn 2001). Original standard ASTM F1622-95 (2000) in PDF full version. Additional info + preview on request

Document status: Replaced by St ASTM F543-23

Standard Terminology Relating to Thermal Imaging Products (Withdrawn 2020). Original standard ASTM F1623-96 (2013) in PDF full version. Additional info + preview on request

Document status: Withdrawn