Moldova standards PDF

Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors (Withdrawn 2011). Original standard ASTM F528-99 (2005) in PDF full version. Additional info + preview on request

Document status: Withdrawn

Method for Interpretation of Interferograms of Nominally Plane Wavefronts (Withdrawn 1994). Original standard ASTM F529-80 (1987)e1 in PDF full version. Additional info + preview on request

Document status: Withdrawn

Test Methods for Measuring Width of Defects in Optical Surfaces, Using Nomarski Differential Microscopy (Withdrawn 1994). Original standard ASTM F532-81 (1987)e1 in PDF full version. Additional info + preview on request

Document status: Withdrawn

Standard Test Method for Thickness and Thickness Variation of Silicon Wafers (Withdrawn 2003). Original standard ASTM F533-02a in PDF full version. Additional info + preview on request

Document status: Withdrawn

Standard Test Method for Bow of Silicon Wafers (Withdrawn 2003). Original standard ASTM F534-02a in PDF full version. Additional info + preview on request

Document status: Withdrawn

Specification for Electrical Performance Characteristics of Vacuum Cleaners (Withdrawn 1985). Original standard ASTM F535-79e1 in PDF full version. Additional info + preview on request

Document status: Withdrawn