Moldova standards PDF

Semiconductor devices - Mechanical and climatic test methods - Part 39- Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components. IEC 60749-39:2021-11(en-fr). Original standard IEC 60749-39-2021 in PDF full version. Additional info + preview on request

Document status: Active

Semiconductor devices - Mechanical and climatic test methods - Part 4- Damp heat, steady state, highly accelerated stress test (HAST). IEC 60749-4:2017-03(en-fr). Original standard IEC 60749-4-2017 in PDF full version. Additional info + preview on request

Document status: Active

Semiconductor devices - Mechanical and climatic test methods - Part 40- Board level drop test method using a strain gauge. IEC 60749-40:2011. Original standard IEC 60749-40-2011 in PDF full version. Additional info + preview on request

Document status: Active

Semiconductor devices - Mechanical and climatic test methods - Part 41- Standard reliability testing methods of non-volatile memory devices. IEC 60749-41:2020-07(en-fr). Original standard IEC 60749-41-2020 in PDF full version. Additional info + preview on request

Document status: Active

Semiconductor devices - Mechanical and climatic test methods - Part 42- Temperature and humidity storage. IEC 60749-42:2014-08(en-fr). Original standard IEC 60749-42-2014 in PDF full version. Additional info + preview on request

Document status: Active

Semiconductor devices - Mechanical and climatic test methods - Part 43- Guidelines for IC reliability qualification plans. IEC 60749-43:2017-06(en-fr). Original standard IEC 60749-43-2017 in PDF full version. Additional info + preview on request

Document status: Replaced by St IEC 63287-1-2021