Moldova standards PDF

Semiconductor devices - Mechanical and climatic test methods - Part 22-2- Bond strength - Wire bond shear test methods. IEC 60749-22-2:2025-11(en). Original standard IEC 60749-22-2-2025 in PDF full version. Additional info + preview on request

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Semiconductor devices - Mechanical and climatic test methods - Part 24- Accelerated moisture resistance - Unbiased HAST. IEC 60749-24:2025-11(en). Original standard IEC 60749-24-2025 in PDF full version. Additional info + preview on request

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Semiconductor devices - Mechanical and climatic test methods - Part 7- Internal moisture content measurement and the analysis of other residual gases. IEC 60749-7:2025-11(en). Original standard IEC 60749-7-2025 in PDF full version. Additional info + preview on request

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Semiconductor devices - Micro-electromechanical devices - Part 49- Temperature and humidity test methods for piezoelectric MEMS cantilevers. IEC 62047-49:2025-11(en). Original standard IEC 62047-49-2025 in PDF full version. Additional info + preview on request

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Plugs, socket-outlets, vehicle connectors and vehicle inlets - Conductive charging of electric vehicles - Part 1- General requirements. IEC 62196-1:2025-11(en). Original standard IEC 62196-1-2025 in PDF full version. Additional info + preview on request

Document status: Active

Plugs, socket-outlets, vehicle connectors and vehicle inlets - Conductive charging of electric vehicles - Part 2- Dimensional compatibility requirements for AC pin and contact-tube accessories. IEC 62196-2:2025-11(en). Original standard IEC 62196-2-2025 in PDF full version. Additional info + preview on request

Document status: Active