Moldova standards PDF

Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1- Test method for bias temperature instability. IEC 63275-1:2022-04(en-fr). Original standard IEC 63275-1-2022 in PDF full version. Additional info + preview on request

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Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2- Test method for bipolar degradation due to body diode operation. IEC 63275-2:2022-05(en-fr). Original standard IEC 63275-2-2022 in PDF full version. Additional info + preview on request

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Binary power generation systems with capacity less than 100 kW - Performance test methods. IEC 63277:2021-11(en). Original standard IEC 63277-2021 in PDF full version. Additional info + preview on request

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Binary power generation systems - Part 3-1- Safety requirements - System with less than 500 kW in capacity. IEC 63277-3-1:2025-02. Original standard IEC 63277-3-1-2025 in PDF full version. Additional info + preview on request

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Asset Administration Shell for industrial applications - Part 1- Asset Administration Shell structure. IEC 63278-1:2023-12(en-fr). Original standard IEC 63278-1-2023 in PDF full version. Additional info + preview on request

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E-Transporters - Part 1- Terminology and classification. IEC 63281-1:2023-07(en-fr). Original standard IEC 63281-1-2023 in PDF full version. Additional info + preview on request

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