JEDEC JEP192-2022 PDF
Name in English:
St JEDEC JEP192-2022
Name in Russian:
Ст JEDEC JEP192-2022
Description in English:
Guidelines for Gate Charge (QG) Test Method for SiC MOSFET. Original document JEDEC JEP192-2022 in PDF full version. Additional info + preview on request
Description in Russian:
Рекомендации по методу испытания заряда затвора (QG) МОП-транзисторов на основе карбида кремния. Оригинальный документ JEDEC JEP192-2022 в PDF полная версия. Дополнительная инфо + превью по запросу
Document status:
Replaced by JEDEC JEP192A-2026
Format:
Electronic (PDF)
Page count:
16
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
2 business days
SKU:
Stjedec000085
More technical details are being prepared for this document.