JEDEC JEP194-2023 PDF
Name in English:
St JEDEC JEP194-2023
Name in Russian:
Ст JEDEC JEP194-2023
Description in English:
Guideline for Gate Oxide Reliability and Robustness Evaluation Procedures for Silicon Carbide Power MOSFETs. Original document JEDEC JEP194-2023 in PDF full version. Additional info + preview on request
Description in Russian:
Руководство по методикам оценки надежности и стойкости подзатворного оксида силовых МОП-транзисторов на основе карбида кремния. Оригинальный документ JEDEC JEP194-2023 в PDF полная версия. Дополнительная инфо + превью по запросу
Document status:
Active
Format:
Electronic (PDF)
Page count:
30
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
3 business days
SKU:
Stjedec000087
More technical details are being prepared for this document.