JEP118A-2018 PDF
Name in English:
St JEP118A-2018
Name in Russian:
Ст JEP118A-2018
Description in English:
Guidelines for GaAs MMIC PHEMT/MESFET and HBT Reliability Accelerated Life Testing. Original document JEP118A-2018 in PDF full version. Additional info + preview on request
Description in Russian:
Руководство по ускоренным ресурсным испытаниям надёжности монолитных СВЧ-интегральных схем GaAs на транзисторах PHEMT/MESFET и HBT. Оригинальный документ JEP118A-2018 в PDF полная версия. Дополнительная инфо + превью по запросу
Document status:
Active
Format:
Electronic (PDF)
Page count:
28
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
3 business days
SKU:
Stjedec000593
More technical details are being prepared for this document.