JEP121B-2020 PDF
Name in English:
St JEP121B-2020
Name in Russian:
Ст JEP121B-2020
Description in English:
Requirements for Microelectronic Screening and Test Optimization. Original document JEP121B-2020 in PDF full version. Additional info + preview on request
Description in Russian:
Требования к оптимизации отбраковки и испытаний микроэлектронных изделий. Оригинальный документ JEP121B-2020 в PDF полная версия. Дополнительная инфо + превью по запросу
Document status:
Active
Format:
Electronic (PDF)
Page count:
41
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
3 business days
SKU:
Stjedec000595
More technical details are being prepared for this document.