JEP148B-2014 PDF
Name in English:
St JEP148B-2014
Name in Russian:
Ст JEP148B-2014
Description in English:
Reliability Qualification of Semiconductor Devices Based on Physics of Failure and Risk and Opportunity Assessment. Original document JEP148B-2014 in PDF full version. Additional info + preview on request
Description in Russian:
Квалификация надёжности полупроводниковых приборов на основе физики отказов и оценки рисков и возможностей. Оригинальный документ JEP148B-2014 в PDF полная версия. Дополнительная инфо + превью по запросу
Document status:
Active
Format:
Electronic (PDF)
Page count:
38
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
3 business days
SKU:
Stjedec000606
More technical details are being prepared for this document.