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Microwave electronic devices. Methods of measuring electrical parameters
Document status: Active
Transistors bipolar. Methods for measuring noise figure at low frequencies
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Optical fibres. Part 1-47. Measurement methods and test procedures. Macrobending loss
Document status: Replaced by GOST R 70144-2022
Optoelectronic integrated microcircuits and opto-couples. Method for measuring leakage current
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Fixed resistors for use in electronic equipment. Part 5. Blank detail specification : fixed precision resistors. Assessment level E
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Systems of data transmission. Circuits and exchange parameters at the interface C3 in parallel input-output of discrete information
Document status: Active