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Variable capacitance diodes. Method for measuring the quality factor
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Optical bench instruments. Height of arrangement of optical axis and exit pupil
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Semiconductor emitters. Methods of measurement of radiant intensity and radiance
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Resistors. Test methods of requirements for design. General
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Reprography. Micrography. Microforms with diazofilms. General technical requirements and methods of control
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Catalogization of products for federal state needs. Forming and maintenance of federal products catalogue data
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