Turkmenistan standards PDF

Test Method for Establishing X-Ray Total Dose Limit for DRAM Devices. Original standard JEDEC JESD22-B130-2022 in PDF full version. Additional info + preview on request

Document status: Active

Field-Induced Charged-Device Model Test Method for Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components. Original standard JEDEC JESD22-C101F-2013 in PDF full version. Additional info + preview on request

Document status: Replaced by

Universal Flash Storage (UFS) Unified Memory Extension Version 1.1. Original document JEDEC JESD220-1A-2016 in PDF. Additional info + preview on request

Document status: Active

Universal Flash Storage (UFS) Card Extension, Version 1.1. Original document JEDEC JESD220-2A-2018 in PDF. Additional info + preview on request

Document status: Active

Universal Flash Storage (UFS) Host Performance Booster (HPB) Extension, Version 1.0. Original document JEDEC JESD220-3-2020 in PDF. Additional info + preview on request

Document status: Active

Universal Flash Storage (UFS) File Based Optimizations (FBO) Extension Version 1.01. Original document JEDEC JESD220-4-2023 in PDF. Additional info + preview on request

Document status: Active