Turkmenistan standards PDF

Standard for the Measurement of CRE. Original standard JEDEC JESD340-1967 (R2009) in PDF full version. Additional info + preview on request

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Procedure for the Wafer-Level Testing of Thin Dielectrics. Original standard JEDEC JESD35-A-2001 in PDF full version. Additional info + preview on request

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The Measurement of Transistor Noise Figure at Frequencies up to 20 kHz by Sinusoidal Signal-Generator Method. Original standard JEDEC JESD353-1968 (R2009) in PDF full version. Additional info + preview on request

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The Measurement of Transistor Equivalent Noise Voltage and Equivalent Noise Current at Frequencies of up to 20 kHz. Original standard JEDEC JESD354-1968 (Reaffirmed 2009) in PDF full version. Additional info + preview on request

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Designation System for Semiconductor Devices. Original standard JEDEC JESD370B-1982 (R2003) in PDF full version. Additional info + preview on request

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The Measurement of Small-Signal VHF-UHF Transistor Short-Circuit Forward Current Transfer Ratio. Original standard JEDEC JESD371-1970 (R2009) in PDF full version. Additional info + preview on request

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