Turkmenistan standards PDF

Standard for the Measurement of Small-Signal Transistor Scattering Parameters. Original standard JEDEC JESD435-1976 (R2009) in PDF full version. Additional info + preview on request

Document status: Active

Customer Notification of Product/Process Changes by Solid-State Suppliers. Original standard JEDEC JESD46D-2011 in PDF full version. Additional info + preview on request

Document status: Replaced by St JEDEC ECIA IPC J-STD-046-2016

Symbol and Label for Electrostatic Sensitive Devices. Original standard JEDEC JESD471-1980 (R2018) in PDF full version. Additional info + preview on request

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Stress-Test-Driven Qualification of Integrated Circuits. Original standard JEDEC JESD47L-2022 in PDF full version. Additional info + preview on request

Document status: Replaced by St JEDEC JESD47N-2026

Stress-Test-Driven Qualification of Integrated Circuits. Original standard JEDEC JESD47N-2026 in PDF full version. Additional info + preview on request

Document status: Active

List of Preferred Values for Use on Various Types of Small Signal and Regulator Diodes. Original standard JEDEC JESD482-A-1984 (Reaffirmed 2002) in PDF full version. Additional info + preview on request

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