TDS PDF

Standard for Description of Low Voltage TTL-Compatible CMOS Logic Devices. Original standard EIA JEDEC JESD52-1995 in PDF full version. Additional info + preview on request

Document status: Active

Standard for Description of 54 74ABTXXX and 74BCXXX TTL-Compatibility BiCMOS Logic Devices. Original standard EIA JEDEC JESD54-1996 in PDF full version. Additional info + preview on request

Document status: Active

Standard for Description of Low-Voltage TTL-Compatible BiCMOS Logic Devices. Original standard EIA JEDEC JESD55-1996 in PDF full version. Additional info + preview on request

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Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation. Original standard EIA JEDEC JESD57-1996 in PDF full version. Additional info + preview on request

Document status: Replaced by St JEDEC JESD57A-2017

Bond Wire Modeling Standard. Original standard EIA JEDEC JESD59-1997 in PDF full version. Additional info + preview on request

Document status: Active

I O Drivers and Receivers with Configurable Communication Voltage, Impedance, and Receiver Threshold. Original standard EIA JEDEC JESD67-1999 in PDF full version. Additional info + preview on request

Document status: Active