Turkmenistan standards PDF

Thermal Resistance Test Method for Signal and Regulator Diodes (Forward Voltage, Switching Method). Original standard JEDEC JESD531-1986 (Reaffirmed 2002) in PDF full version. Additional info + preview on request

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Statistical Process Control Systems. Original standard JEDEC JESD557D-2023 in PDF full version. Additional info + preview on request

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Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation. Original standard JEDEC JESD57A-2017 in PDF full version. Additional info + preview on request

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Measurement of Small Values of Transistor Capacitance. Original standard JEDEC JESD6-1967 (2002) in PDF full version. Additional info + preview on request

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A Procedure for Measuring P-Channel MOSFET Hot-Carrier-Induced Degradation Under DC Stress. Original standard JEDEC JESD60A-2004 in PDF full version. Additional info + preview on request

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Isothermal Electromigration Test Procedure. Original standard JEDEC JESD61A.01-2007 in PDF full version. Additional info + preview on request

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