Turkmenistan standards PDF

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St JEDEC JESD51-13-2009

Glossary of Thermal Measurement Terms and Definitions. Original document JEDEC JESD51-13-2009 in PDF full version. Additional info + preview on request

Document status: Active

€35
St JEDEC JESD51-14-2010

Transient Dual Interface Test Method for the Measurement of the Thermal Resistance Junction to Case of Semiconductor Devices with Heat Flow Through a Single Path. Original standard JEDEC JESD51-14-2010 in PDF full version. Additional info + preview on request

Document status: Active

€35
St JEDEC JESD51-2A-2008

Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air). Original standard JEDEC JESD51-2A-2008 in PDF full version. Additional info + preview on request

Document status: Active

€35
St JEDEC JESD51-31-2008

Thermal Test Environment Modifications for MultiChip Packages. Original standard JEDEC JESD51-31-2008 in PDF full version. Additional info + preview on request

Document status: Active

€35
St JEDEC JESD51-32-2010

Extension to JESD51 Thermal Test Board Standards to Accommodate Multi-Chip Packages. Original document JEDEC JESD51-32-2010 in PDF. Additional info + preview on request

Document status: Active

€35
St JEDEC JESD51-4A-2019

Thermal Test Chip Guideline (Wire Bond and Flip Chip). Original standard JEDEC JESD51-4A-2019 in PDF full version. Additional info + preview on request

Document status: Active

€35
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