Turkmenistan standards PDF

Interface Standard for Nominal 3 V/3.3 V Supply Digital Integrated Circuits. Original standard JEDEC JESD8C.01-2007 in PDF full version. Additional info + preview on request

Document status: Active

A Procedure for Measuring P-Channel MOSFET Negative Bias Temperature Instabilities. Original standard JEDEC JESD90-2004 in PDF full version. Additional info + preview on request

Document status: Replaced by St JEDEC JESD241-2015

Method for Developing Acceleration Models for Electronic Device Failure Mechanisms. Original standard JEDEC JESD91B-2022 in PDF full version. Additional info + preview on request

Document status: Active

Procedure for Characterizing Time-Dependent Dielectric Breakdown of Ultra-Thin Gate Dielectrics. Original standard JEDEC JESD92-2003 in PDF full version. Additional info + preview on request

Document status: Replaced by

Multichip Modules (MCM). Original standard JEDEC JESD93A-2022 in PDF full version. Additional info + preview on request

Document status: Active

Application Specific Qualification Using Knowledge Based Test Methodology. Original standard JEDEC JESD94B-2015 (R2021) in PDF full version. Additional info + preview on request

Document status: Active