Turkmenistan standards PDF

Long-Term Storage for Electronic Solid-State Wafers, Dice, and Devices. Original document JEDEC JEP160A-2022 in PDF full version. Additional info + preview on request

Document status: Active

System Level ESD. Part II- Implementation of Effective ESD Robust Designs. Original document JEDEC JEP162A-2019 in PDF full version. Additional info + preview on request

Document status: Active

Selection of Burn-In/Life Test Conditions and Critical Parameters for QML Microcircuits. Original document JEDEC JEP163A-2022 in PDF full version. Additional info + preview on request

Document status: Active

System Level ESD. Part III- Review of ESD Testing and Impact on System-Efficient ESD Design (SEED). Original document JEDEC JEP164-2022 in PDF full version. Additional info + preview on request

Document status: Active

JC-42.6 Manufacturer Identification (ID) Code for Low Power Memories. Original standard JEDEC JEP166E-2023 in PDF full version. Additional info + preview on request

Document status: Replaced by St JEDEC JEP166F-2025

JC-42.6 Manufacturer Identification (ID) Code for Low Power Memories. Original document JEDEC JEP166F-2025 in PDF full version. Additional info + preview on request

Document status: Replaced by