Turkmenistan standards PDF

Guideline for Evaluating dv/dt Robustness of SiC Power Devices, Version 1.0. Original document JEDEC JEP190-2022 in PDF full version. Additional info + preview on request

Document status: Replaced by

Guidelines for Gate Charge (QG) Test Method for SiC MOSFET. Original document JEDEC JEP192-2022 in PDF full version. Additional info + preview on request

Document status: Replaced by

Survey on Latch-Up Testing Practices and Recommendations for Improvements. Original document JEDEC JEP193-2022 in PDF full version. Additional info + preview on request

Document status: Active

Guideline for Gate Oxide Reliability and Robustness Evaluation Procedures for Silicon Carbide Power MOSFETs. Original document JEDEC JEP194-2023 in PDF full version. Additional info + preview on request

Document status: Active

Guideline for Evaluating Gate Switching Instability of Silicon Carbide Metal-Oxide-Semiconductor Devices for Power Electronic Conversion. Original document JEDEC JEP195-2023 in PDF full version. Additional info + preview on request

Document status: Active

A Case for Lowering Component-level CDM ESD Specifications and Requirements. Part II- Die-to-Die Interfaces. Original document JEDEC JEP196-2023 in PDF full version. Additional info + preview on request

Document status: Active