Turkmenistan standards PDF
Characterization of Interfacial Adhesion in Semiconductor Packages. Original document JEDEC JEP167A-2020 in PDF full version. Additional info + preview on request
Document status: Active
Guidelines for Visual Inspection and Control of Flip Chip Type Packages (FCxGA). Original document JEDEC JEP170A-2024 in PDF full version. Additional info + preview on request
Document status: Active
GDDR5 Measurement Procedures. Original document JEDEC JEP171-2014 in PDF full version. Additional info + preview on request
Document status: Active
Discontinuing Use of the Machine Model for Device ESD Qualification. Original document JEDEC JEP172A-2015 (2020) in PDF full version. Additional info + preview on request
Document status: Active
Dynamic ON-Resistance Test Method Guidelines for GaN HEMT based Power Conversion Devices, Version 1.0. Original document JEDEC JEP173-2019 in PDF full version. Additional info + preview on request
Document status: Active
Understanding Electrical Overstress - EOS. Original document JEDEC JEP174-2016 in PDF full version. Additional info + preview on request
Document status: Active